Measurement System for Thin Films on LCD and Wafer is a new-age reasonably priced instrument for measurement of such characteristics of thin films as thickness and optical constants. We can provide 50x50cm sample stage for wafer measurement and one square meter sample stage for LCD measurement. Optionally we provide programmable X-Y stage, motorized Z axis, CCD camera, auto focusing. The measurement range is 100A-50um.The measured spot size is 40/20/10/4 um. Data acquisition time is typically 0.5 sec.
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