High Quality, Competitively Priced Refractive Index and Thin Film Thickness Measurement System is intended specially for precise refractive index measurement. Based on Dual Reflectometer, this instrument allows to measure not only normal vertical reflectance, but also incident one. Besides it can be applied to measure thin film thickness. Please, contact us for specifications.

Company name:	K-MAC, Korea Materials & Analysis Corporation
Company type:	Service, Other
Contact Person:	Ms Vera Shapovalova Send Inquiry
City:	Taejon
State:
Country:	South Korea $Refractive Index Meas. System$
Zip:	( This info for Premium members only )
Phone:	( This info for Premium members only )
Fax:	( This info for Premium members only )
Website:	( This info for Premium members only )

Offers list from this company: [Sell] Refractive Index Meas. System [Sell] Chiral HPLC Columns [Sell] Thin Film Measurement System [Sell] UV-Vis Spectrophotometer

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